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SNJ54BCT8374AJT
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
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SNJ54BCT8374AJT
-
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
Active
厂商
Texas Instruments
Tube
系列
*